Wavelet filtering of fractal surfaces;Wavelet-filterung von fraktalen oberflächen

Technisches Messen

Volumn 75, Issue 5, 2008, Pages 339-345

  Bakucz, Peter ^a   Krüger Sehm, Rolf ^a   Schröder, Sven ^b   Duparré, Angela ^b   Tünnermann, Andreas ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

Fractals; Light scattering; PSD; Roughness; Wavelet filtering

Indexed keywords

FRACTAL SURFACES; LIGHT SCATTERING MEASUREMENT; PSD; ROUGHNESS SPECTRUM; SCATTERING DISTRIBUTIONS; STATISTICAL FLUCTUATIONS; SURFACE NANOSTRUCTURE; WAVELET-FILTERING;

FRACTALS; LIGHT SCATTERING; STATISTICAL MECHANICS;

SURFACE ROUGHNESS;

EID: 67651009672     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: 10.1524/teme.2008.0876     Document Type: Article

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