-
1
-
-
0020845426
-
Absolute Onset of Optical Surface Damage using Distributed Defect Ensembles
-
Porteus, J.O. & Seitel, S.C. (1984), 'Absolute Onset of Optical Surface Damage using Distributed Defect Ensembles', Appl. Opt. 23(21), 3796-3805.
-
(1984)
Appl. Opt
, vol.23
, Issue.21
, pp. 3796-3805
-
-
Porteus, J.O.1
Seitel, S.C.2
-
2
-
-
20544457040
-
Two Mechanisms of Crater Formation in Ultraviolet-Pulsed-Laser Irradiation SiO2 Thin Films with Articial Defects
-
Papernov, S. & Schmid, A. (2005), Two Mechanisms of Crater Formation in Ultraviolet-Pulsed-Laser Irradiation SiO2 Thin Films with Articial Defects', J.Appl.Phys. 97. 114906-1
-
(2005)
J.Appl.Phys
, vol.97
, pp. 114906-114901
-
-
Papernov, S.1
Schmid, A.2
-
3
-
-
0031289730
-
Interfacial Effects on the Transient Temperature Rise of Multilayer Coatings Induced by a Short-Pulse Laser Irradiation
-
Zhao, Q.; Wu, M. & Han, Y. (1998), 'Interfacial Effects on the Transient Temperature Rise of Multilayer Coatings Induced by a Short-Pulse Laser Irradiation', Proceedings of Spie Vol 3244, 491-498
-
(1998)
Proceedings of Spie
, vol.3244
, pp. 491-498
-
-
Zhao, Q.1
Wu, M.2
Han, Y.3
-
5
-
-
33144488353
-
Laser-Induced Damage of Dielectric Systems with Gradual Interfaces at 1.064nm
-
Ristau, D.; Schink, H.; Mittendorf, F.; Akhtar, J.; Ebert, J. & Welling, H. (1989), 'Laser-Induced Damage of Dielectric Systems with Gradual Interfaces at 1.064nm', NIST Spec. Publ. 775, 414-426.
-
(1989)
NIST Spec. Publ
, vol.775
, pp. 414-426
-
-
Ristau, D.1
Schink, H.2
Mittendorf, F.3
Akhtar, J.4
Ebert, J.5
Welling, H.6
-
6
-
-
34247333031
-
-
Apfel, J.H.; Enemark, E.A.; Milam, D.; L., S.W. & J., W.M. (1977), The Effects of Barrier Layers and Surface Smoothness on 150-ps, 1,064-μm Laser Damage of AR Coatings on Glass', Proceedings of Spie 509, 255-259.
-
Apfel, J.H.; Enemark, E.A.; Milam, D.; L., S.W. & J., W.M. (1977), "The Effects of Barrier Layers and Surface Smoothness on 150-ps, 1,064-μm Laser Damage of AR Coatings on Glass', Proceedings of Spie 509, 255-259.
-
-
-
-
7
-
-
4243166810
-
Damage Threshold Depencence on Film Thickness
-
Zhouling, W.; Zhengxiu, F. & Zhijiang, W. (1988), 'Damage Threshold Depencence on Film Thickness', Proceedings of Spie 775, 321-327.
-
(1988)
Proceedings of Spie
, vol.775
, pp. 321-327
-
-
Zhouling, W.1
Zhengxiu, F.2
Zhijiang, W.3
-
8
-
-
3242749008
-
Towards rapid prototyping in thin film technology
-
E. Masetti, D. Ristau and A. Krasilnikova eds
-
D. Ristau, T. Groß, M. Lappschies and K. Starke: Towards rapid prototyping in thin film technology. In E. Masetti, D. Ristau and A. Krasilnikova (eds.): Proceedings of the Workshop on Optical coatings: Theory, Production and Characterisation p. 29-35 2003
-
(2003)
Proceedings of the Workshop on Optical coatings: Theory, Production and Characterisation
, pp. 29-35
-
-
Ristau, D.1
Groß, T.2
Lappschies, M.3
Starke, K.4
-
9
-
-
27944471501
-
Application of Optical Broad Band Monitoring to Quasi-Rugate Filters by Ion Beam Sputtering
-
Optical Interference Coatings
-
Lappschies, M.; Görtz, B. & Ristau, D. (2004),Application of Optical Broad Band Monitoring to Quasi-Rugate Filters by Ion Beam Sputtering, in 'Optical Interference Coatings', OSA Technical Digest, pp. TuE4.
-
(2004)
OSA Technical Digest
-
-
Lappschies, M.1
Görtz, B.2
Ristau, D.3
-
10
-
-
34247387178
-
-
,'ISO 11254-2: Test methods for laser induced damage threshold of optical surfaces. Part 2: S on 1 test', International Organization for Standardization, Technical Comittee: Optics and Optical Instruments, subcomittee: Lasers and Laser-Related Equipment, International Standard, Genéve, Switzerland, International Organization for Standardization.
-
(2001),'ISO 11254-2: Test methods for laser induced damage threshold of optical surfaces. Part 2: S on 1 test', International Organization for Standardization, Technical Comittee: Optics and Optical Instruments, subcomittee: Lasers and Laser-Related Equipment, International Standard, Genéve, Switzerland, International Organization for Standardization.
-
-
-
-
11
-
-
34247346991
-
-
Wu, B.; Jensen, Jupé M.; Starke, K. & Ristau, D. (2006), 'Morphology Investigations of Laser Induced Damage', Proccidings of Spie 6403-48.
-
Wu, B.; Jensen, Jupé M.; Starke, K. & Ristau, D. (2006), 'Morphology Investigations of Laser Induced Damage', Proccidings of Spie 6403-48.
-
-
-
-
12
-
-
33646012669
-
Scaling law investigations in spot sizes dependence in the ns regime
-
Jupé, M.; Jensen, L.; Mädebach, H.; Starke, K.; Ristau, D.; Lien, Y. & Wernham, D. (2006), 'Scaling law investigations in spot sizes dependence in the ns regime', Proceedings of SPIE 6100-6108, 61011G-1-11.
-
(2006)
Proceedings of SPIE 6100-6108, 61011G-1-11
-
-
Jupé, M.1
Jensen, L.2
Mädebach, H.3
Starke, K.4
Ristau, D.5
Lien, Y.6
Wernham, D.7
-
13
-
-
34247346128
-
-
,'ISO 11551: Test Method for Absorptance of Optical Laser Components', International Organization for Standardization, Technical Comittee: Optics and Optical Instruments, subcomittee: Lasers and Laser-Related Equipment, International Standard, Genéve, Switzerland, International Organization for Standardization.
-
(1997),'ISO 11551: Test Method for Absorptance of Optical Laser Components', International Organization for Standardization, Technical Comittee: Optics and Optical Instruments, subcomittee: Lasers and Laser-Related Equipment, International Standard, Genéve, Switzerland, International Organization for Standardization.
-
-
-
-
14
-
-
0037112989
-
2 Thin Film and Nanoscale Crater Formation Induced by Pulsed-Laser Radiation
-
2 Thin Film and Nanoscale Crater Formation Induced by Pulsed-Laser Radiation', Appl. Phys. 92(10), 5720-5728.
-
(2002)
Appl. Phys
, vol.92
, Issue.10
, pp. 5720-5728
-
-
Papernov, S.1
Schmid, A.W.2
-
15
-
-
0017248515
-
-
Apfel, J.H.; Matteucci, J.; Newnarn, B. & Gill, D. (1976), 'The Role of Electric Field Strength in Laser Damage of Dielectric Multilayers', MBS Spe. Pub., 301.
-
[13] Apfel, J.H.; Matteucci, J.; Newnarn, B. & Gill, D. (1976), 'The Role of Electric Field Strength in Laser Damage of Dielectric Multilayers', MBS Spe. Pub., 301.
-
-
-
-
16
-
-
0032689295
-
Comparison of Production Techniques for Silicon Oxynitride Rugates and their Effect on Laser Damage Thresholds
-
[14] Lewis, K.L.; Blacker, R.; Corbett, M.; Gurtman, G.A. & Wilson, R.S. (1999), 'Comparison of Production Techniques for Silicon Oxynitride Rugates and their Effect on Laser Damage Thresholds', Proc. SPIE 3578, 179-187.
-
(1999)
Proc. SPIE
, vol.3578
, pp. 179-187
-
-
Lewis, K.L.1
Blacker, R.2
Corbett, M.3
Gurtman, G.A.4
Wilson, R.S.5
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