Applications of ellipsometry in nanoscale science: Needs, status, achievements and future challenges

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2575-2583

  Losurdo, Maria ^a  

^a CNR   (Italy)

Author keywords

Ellipsometry; Gold nanoparticles; Nanoscience; Nanotechnology; Plasmonics

Indexed keywords

BURIED INTERFACE; COMMERCIAL PRODUCTS; DIELECTRIC FUNCTIONS; ELLIPSOMETRIC MEASUREMENTS; FUTURE CHALLENGES; GOLD NANOPARTICLES; NANO-MATERIALS; NANOMETROLOGY; NANOSCALE SCIENCE; OPTICAL CHARACTERIZATION; PLASMONIC; PLASMONICS; REAL TIME; SILICON SUBSTRATES; SIZE EFFECTS;

ELLIPSOMETRY; GOLD; NANOPARTICLES; NANOSTRUCTURED MATERIALS; PLASMONS;

NANOSCIENCE;

EID: 79952628488     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.11.066     Document Type: Article

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