Controlling the microstructure of solution-processable small molecules in thin-film transistors through substrate chemistry

Chemistry of Materials

Volumn 23, Issue 5, 2011, Pages 1194-1203

  Kline, R Joseph ^a   Hudson, Steven D ^a   Zhang, Xinran ^a   Gundlach, David J ^a   Moad, Andrew J ^a   Jurchescu, Oana D ^b   Jackson, Thomas N ^c   Subramanian, Sankar ^d   Anthony, John E ^d   Toney, Michael F ^e   Richter, Lee J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b WAKE FOREST UNIVERSITY   (United States)

^c The Pennsylvania State University   (United States)

^d UNIVERSITY OF KENTUCKY   (United States)

^e SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

crystal habits; FTIR; grazing incidence X ray diffraction; morphology; organic electronics; TESADT; thin film transistors; transmission electron microscopy

Indexed keywords

CRYSTAL HABITS; FTIR; GRAZING-INCIDENCE X-RAY DIFFRACTION; ORGANIC ELECTRONICS; TESADT;

CRYSTAL GROWTH; CRYSTALLIZATION; DIFFRACTION; ELECTRODES; FILM GROWTH; MORPHOLOGY; PLATELETS; THIN FILM TRANSISTORS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CARRIER MOBILITY;

EID: 79952119245     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm102834m     Document Type: Article

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