Modeling, architecture, and applications for emerging memory technologies

IEEE Design and Test of Computers

Volumn 28, Issue 1, 2011, Pages 44-50

  Xie, Yuan ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

design and test; eDRAM; memory hierarchy; memory technologies; nonvolatile memory; NVM; PCRAM; RRAM; SRAM; STT RAM

Indexed keywords

DESIGN AND TESTS; EDRAM; MEMORY HIERARCHY; MEMORY TECHNOLOGIES; NON-VOLATILE MEMORIES; NVM; PCRAM; RRAM; SRAM; STT-RAM;

DESIGN; PHASE CHANGE MEMORY; STATIC RANDOM ACCESS STORAGE; TECHNOLOGY;

MEMORY ARCHITECTURE;

EID: 79951568673     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2011.20     Document Type: Article

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