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Volumn 8, Issue 2, 2011, Pages 308-314

Fault injection in modern microprocessors using on-chip debugging infrastructures

Author keywords

COTS microprocessors; fault injection; fault tolerance; single event upset; soft errors

Indexed keywords

COMMERCIAL OFF-THE-SHELF; COMPUTER DEBUGGING; COST EFFECTIVENESS; FAULT TOLERANCE; RADIATION HARDENING; SOFTWARE TESTING;

EID: 78951489503     PISSN: 15455971     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDSC.2010.50     Document Type: Article
Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.