-
2
-
-
9144234352
-
Characterization of soft errors caused by single event upsets in CMOS processes
-
Apr.-June
-
T. Karnik, P. Hazucha, and J. Patel, "Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes," IEEE Trans. Dependable and Secure Computing, vol. 1, no. 2, pp. 128-143, Apr.-June 2004.
-
(2004)
IEEE Trans. Dependable and Secure Computing
, vol.1
, Issue.2
, pp. 128-143
-
-
Karnik, T.1
Hazucha, P.2
Patel, J.3
-
3
-
-
29344472607
-
Radiation-induced soft errors in advanced semiconductor technologies
-
Sept.
-
R.C. Baumann, "Radiation-Induced Soft Errors in Advanced Semiconductor Technologies," IEEE Trans. Device and Materials Reliability, vol. 5, no. 3, pp. 305-316, Sept. 2005.
-
(2005)
IEEE Trans. Device and Materials Reliability
, vol.5
, Issue.3
, pp. 305-316
-
-
Baumann, R.C.1
-
4
-
-
15044363155
-
Robust system design with built-in soft-error resilience
-
DOI 10.1109/MC.2005.70
-
S. Mitra, N. Seifert, M. Zhang, Q. Shi, and K.S. Kim, "Robust System Design with Built-In Soft Error Resilience," Computer, vol. 38, no. 2, pp. 43-52, Feb. 2005. (Pubitemid 40377402)
-
(2005)
Computer
, vol.38
, Issue.2
, pp. 43-52
-
-
Mitra, S.1
Seifert, N.2
Zhang, M.3
Shi, Q.4
Kim, K.S.5
-
5
-
-
1242265245
-
Impact of data cache memory on the single event upset-induced error rate of microprocessors
-
Dec.
-
F. Faure, R. Velazco, M. Violante, M. Rebaudengo, and M. Sonza Reorda, "Impact of Data Cache Memory on the Single Event Upset-Induced Error Rate of Microprocessors," IEEE Trans. Nuclear Science, vol. 50, no. 6, pp. 2101-2106 , Dec. 2003.
-
(2003)
IEEE Trans. Nuclear Science
, vol.50
, Issue.6
, pp. 2101-2106
-
-
Faure, F.1
Velazco, R.2
Violante, M.3
Rebaudengo, M.4
Sonza Reorda, M.5
-
6
-
-
0028018774
-
Fault injection into VHDL models: The MEFISTO tool
-
E. Jenn, J. Arlat, M. Rimen, J. Ohlsson, and J. Karlsson, "Fault Injection into VHDL Models: The MEFISTO Tool," Proc. 24th Int'l Symp. Fault Tolerance Computing (FTCS-24), pp. 66-75, 1994.
-
(1994)
Proc. 24th Int'l Symp. Fault Tolerance Computing (FTCS-24)
, pp. 66-75
-
-
Jenn, E.1
Arlat, J.2
Rimen, M.3
Ohlsson, J.4
Karlsson, J.5
-
7
-
-
84893748923
-
New techniques for speeding-up fault injection campaigns
-
L. Berrojo, F. Corno, L. Entrena, I. Gonzalez, C. Lopez, M. Sonza Reorda, and G. Squillero, "New Techniques for Speeding-Up Fault Injection Campaigns," Proc. Design, Automation and Test in Europe Conf., 2002.
-
(2002)
Proc. Design, Automation and Test in Europe Conf.
-
-
Berrojo, L.1
Corno, F.2
Entrena, L.3
Gonzalez, I.4
Lopez, C.5
Sonza Reorda, M.6
Squillero, G.7
-
8
-
-
36348947597
-
Study of the effects of SEU-Induced faults on a pipeline-protected microprocessor
-
Dec.
-
E. Touloupis, J.A. Flint, V.A. Chouliaras, and D.D. Ward, "Study of the Effects of SEU-Induced Faults on a Pipeline-Protected Microprocessor," IEEE Trans. Computers, vol. 56, no. 12, pp. 1585-1596, Dec. 2007.
-
(2007)
IEEE Trans. Computers
, vol.56
, Issue.12
, pp. 1585-1596
-
-
Touloupis, E.1
Flint, J.A.2
Chouliaras, V.A.3
Ward, D.D.4
-
9
-
-
77957996305
-
Analysis of SEU effects in a pipelined microprocessor
-
M. Rebaudengo, M. Sonza Reorda, and M. Violante, "Analysis of SEU Effects in a Pipelined Microprocessor," Proc. IEEE Int'l OnLine Testing Workshop, pp. 206-210, 2002.
-
(2002)
Proc. IEEE Int'l OnLine Testing Workshop
, pp. 206-210
-
-
Rebaudengo, M.1
Sonza Reorda, M.2
Violante, M.3
-
10
-
-
33847733939
-
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
-
Feb.
-
C. López-Ongil, M. García-Valderas, M. Portela- García, and L. Entrena, "Autonomous Fault Emulation: A New FPGA-Based Acceleration System for Hardness Evaluation," IEEE Trans. Nuclear Science, vol. 54, no. 1, pp. 252-261, Feb. 2007.
-
(2007)
IEEE Trans. Nuclear Science
, vol.54
, Issue.1
, pp. 252-261
-
-
López-Ongil, C.1
García-Valderas, M.2
Portela-García, M.3
Entrena, L.4
-
11
-
-
0034501974
-
Using run-time reconfiguration for fault injection in hardware prototypes
-
L. Antoni, R. Leveugle, and B. Feher, "Using Run-Time Reconfiguration for Fault Injection in Hardware Prototypes," Proc. IEEE Int'l Symp. Defect and Fault Tolerance in VLSI Systems, pp. 405-413, 2000.
-
(2000)
Proc. IEEE Int'l Symp. Defect and Fault Tolerance in VLSI Systems
, pp. 405-413
-
-
Antoni, L.1
Leveugle, R.2
Feher, B.3
-
12
-
-
34548082407
-
Ft-Unshades: A new system for SEU injection, analysis and diagnostics over post synthesis netlist
-
M.A. Aguirre, J.N. Tombs, V. Baena, F. Muñoz-Chavero, A. Torralba, A. Fernández-Leó n, and F. Tortosa, "Ft-Unshades: A New System for SEU Injection, Analysis and Diagnostics over Post Synthesis Netlist," NASA Military and Aerospace Programmable Logic Devices (MAPLD), 2005.
-
(2005)
NASA Military and Aerospace Programmable Logic Devices (MAPLD)
-
-
Aguirre, M.A.1
Tombs, J.N.2
Baena, V.3
Muñoz-Chavero, F.4
Torralba, A.5
Fernández-León, A.6
Tortosa, F.7
-
13
-
-
0032002385
-
Xception: A technique for the experimental evaluation of dependability in modern computers
-
Feb.
-
J. Carreira, H. Madeira, and J.G. Silva, "Xception: A Technique for the Experimental Evaluation of Dependability in Modern Computers," IEEE Trans. Software Eng., vol. 24, no. 2, pp. 125-136, Feb. 1998.
-
(1998)
IEEE Trans. Software Eng.
, vol.24
, Issue.2
, pp. 125-136
-
-
Carreira, J.1
Madeira, H.2
Silva, J.G.3
-
14
-
-
0034450666
-
Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) Injection
-
Dec.
-
R. Velazco, S. Rezgui, and R. Ecoffet, "Predicting Error Rate for Microprocessor-Based Digital Architectures Through C.E.U. (Code Emulating Upsets) Injection," IEEE Trans. Nuclear Science, vol. 47, no. 6, pp. 2405- 2411, Dec. 2000.
-
(2000)
IEEE Trans. Nuclear Science
, vol.47
, Issue.6
, pp. 2405-2411
-
-
Velazco, R.1
Rezgui, S.2
Ecoffet, R.3
-
15
-
-
0026880102
-
Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor
-
DOI 10.1109/23.277533
-
R. Velazco, S. Karoui, T. Chapuis, D. Benezech, and L.H. Rosier, "Heavy Ion Test Results for the 68020 Microprocessor and the 68882 CoMicroprocessor," IEEE Trans. Nuclear Science, vol. 39, no. 3, pp. 436-440, June 1992. (Pubitemid 23556150)
-
(1992)
IEEE Transactions on Nuclear Science
, vol.39
, Issue.3 PART I
, pp. 436-440
-
-
Velazco, R.1
Karoui, S.2
Chapuis, T.3
Benezech, D.4
Rosier, L.H.5
-
16
-
-
0002598384
-
Application of three physical fault injection techniques to the experimental assessment of the mars architecture
-
Sept.
-
J. Karlsson, P. Folkesson, J. Arlat, Y. Crouzet, G. Leber, and J. Reisinger, "Application of Three Physical Fault Injection Techniques to the Experimental Assessment of the MARS Architecture," Proc. Int'l Working Conf. Dependable Computing for Critical Applications, pp. 150-161, Sept. 1995.
-
(1995)
Proc. Int'l Working Conf. Dependable Computing for Critical Applications
, pp. 150-161
-
-
Karlsson, J.1
Folkesson, P.2
Arlat, J.3
Crouzet, Y.4
Leber, G.5
Reisinger, J.6
-
17
-
-
4043179001
-
Time-Resolved scanning of integrated circuits with a pulsed laser: Application to transient fault injection in an ADC
-
Aug.
-
V. Pouget, D. Lewis, and P. Fouillat, "Time-Resolved Scanning of Integrated Circuits with a Pulsed Laser: Application to Transient Fault Injection in an ADC," IEEE Trans. Instrumentation and Measurement, vol. 53, no. 4, pp. 1227-1231, Aug. 2004.
-
(2004)
IEEE Trans. Instrumentation and Measurement
, vol.53
, Issue.4
, pp. 1227-1231
-
-
Pouget, V.1
Lewis, D.2
Fouillat, P.3
-
18
-
-
33745495021
-
On the proposition of an emi-based fault injection approach
-
July
-
F. Vargas, D.L. Cavalcante, E. Gatti, D. Prestes, and D. Lupi, "On the Proposition of an EMI-Based Fault Injection Approach," Proc. 11th IEEE Int'l OnLine Testing Symp., pp. 207-208, July 2005.
-
(2005)
Proc. 11th IEEE Int'l OnLine Testing Symp.
, pp. 207-208
-
-
Vargas, F.1
Cavalcante, D.L.2
Gatti, E.3
Prestes, D.4
Lupi, D.5
-
19
-
-
52649105030
-
Online estimation of architectural vulnerability factor for soft errors
-
June
-
X. Li, S.V. Adve, P. Bose, and J.A. Rivers, "Online Estimation of Architectural Vulnerability Factor for Soft Errors," Proc. Int'l Symp. Computer Architecture, pp. 341-352, June 2008.
-
(2008)
Proc. Int'l Symp. Computer Architecture
, pp. 341-352
-
-
Li, X.1
Adve, S.V.2
Bose, P.3
Rivers, J.A.4
-
20
-
-
0032637390
-
Evaluating the fault tolerance capabilities of embedded systems via BDM
-
Apr.
-
M. Rebaudengo and M. Sonza Reorda, "Evaluating the Fault Tolerance Capabilities of Embedded Systems via BDM," Proc. 17th IEEE VLSI Test Symp., pp. 452-457, Apr. 1999.
-
(1999)
Proc. 17th IEEE VLSI Test Symp.
, pp. 452-457
-
-
Rebaudengo, M.1
Sonza Reorda, M.2
-
21
-
-
33750937423
-
Validation of fault tolerance mechanisms of an onboard system
-
Jan.
-
J. Peng, J. Ma, B. Hong, and C. Yuan, "Validation of Fault Tolerance Mechanisms of an Onboard System," Proc. First Int'l Symp. Systems and Control in Aerospace and Astronautics, pp. 1230-1234, Jan. 2006.
-
(2006)
Proc. First Int'l Symp. Systems and Control in Aerospace and Astronautics
, pp. 1230-1234
-
-
Peng, J.1
Ma, J.2
Hong, B.3
Yuan, C.4
-
23
-
-
78951487736
-
A fault injection environment for SoPC's embedded microprocessors
-
Mar.
-
M. Portela-Garcia, L. Sterpone, C. Lopez-Ongil, M. Sonza-Reorda, and M. Violante, "A Fault Injection Environment for SoPC's Embedded Microprocessors," Proc. Seventh Ann. IEEE Latin Am. Test Workshop, Mar. 2006.
-
(2006)
Proc. Seventh Ann. IEEE Latin Am. Test Workshop
-
-
Portela-Garcia, M.1
Sterpone, L.2
Lopez-Ongil, C.3
Sonza-Reorda, M.4
Violante, M.5
-
24
-
-
33845380514
-
Fault injection-based reliability evaluation of SoPCs
-
May
-
M. Sonza Reorda, L. Sterpone, M. Violante, M. Portela-García, C. Lopez- Ongil, and L. Entrena, "Fault Injection-Based Reliability Evaluation of SoPCs," Proc. 11th IEEE European Test Symp., pp. 75-82, May 2006.
-
(2006)
Proc. 11th IEEE European Test Symp.
, pp. 75-82
-
-
Sonza Reorda, M.1
Sterpone, L.2
Violante, M.3
Portela-García, M.4
Lopez- Ongil, C.5
Entrena, L.6
-
25
-
-
33846276877
-
Hybrid fault detection technique: A case study on virtex-ii pro's powerPC 405
-
Dec.
-
P. Bernardi, L. Sterpone, M. Violante, and M. Portela-Garcia, "Hybrid Fault Detection Technique: A Case Study on Virtex-II Pro's PowerPC 405," IEEE Trans. Nuclear Science, vol. 53, no. 6, pp. 3550-3557, Dec. 2006.
-
(2006)
IEEE Trans. Nuclear Science
, vol.53
, Issue.6
, pp. 3550-3557
-
-
Bernardi, P.1
Sterpone, L.2
Violante, M.3
Portela-Garcia, M.4
-
26
-
-
46749149248
-
A rapid fault injection approach for measuring SEU sensitivity in complex processors
-
July
-
M. Portela-Garcia, C. López-Ongil, M. García-Valderas, and L. Entrena, "A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors," Proc. 13th IEEE Int'l OnLine Testing Symp., pp. 101-106, July 2007.
-
(2007)
Proc. 13th IEEE Int'l OnLine Testing Symp.
, pp. 101-106
-
-
Portela-Garcia, M.1
López-Ongil, C.2
García-Valderas, M.3
Entrena, L.4
-
27
-
-
0003415191
-
IEEE standard test access port and boundary-scan architecture
-
IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Standard 1141.1-2001, 2001.
-
(2001)
IEEE Standard 1141.1-2001
-
-
-
29
-
-
78951487880
-
-
2010
-
www.xilinx.com, 2010.
-
-
-
|