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Volumn 2005, Issue , 2005, Pages 207-208

On the proposition of an EMI-based fault injection approach

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33745495021     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.47     Document Type: Conference Paper
Times cited : (13)

References (5)
  • 1
    • 0029379203 scopus 로고
    • Evaluating processor-behavior and three error-detection mechanisms using physical fault-injection
    • September
    • Miremadi, G.; Torin, J. Evaluating Processor-Behavior and Three Error-Detection Mechanisms Using Physical Fault-Injection. IEEE Transactions on Reliability. Vol. 44, No. 3, September 1995. pp. 441-454.
    • (1995) IEEE Transactions on Reliability , vol.44 , Issue.3 , pp. 441-454
    • Miremadi, G.1    Torin, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.