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Volumn , Issue , 2002, Pages 847-852

New techniques for speeding-up fault-injection campaigns

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL TOOLS; FAULT TOLERANCE MECHANISMS; FAULT-TOLERANT; FAULT-TOLERANT MECHANISM; INDUSTRIAL ENVIRONMENTS; ITS EVALUATION; REGISTER TRANSFER LEVEL; VHDL DESCRIPTION;

EID: 84893748923     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998398     Document Type: Conference Paper
Times cited : (70)

References (8)
  • 1
    • 0032684765 scopus 로고    scopus 로고
    • Time redundancy based soft-error tolerance to rescue nanometer technologies
    • April
    • M. Nikoladis, Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies, IEEE 17th VLSI Test Symposium, April 1999, pp. 86-94
    • (1999) IEEE 17th VLSI Test Symposium , pp. 86-94
    • Nikoladis, M.1
  • 2
    • 0031123369 scopus 로고    scopus 로고
    • Fault injection techniques and tools
    • April
    • M.C. Hsueh, T. K. Tsai, R. K. Iyer, "Fault Injection Techniques and Tools", Computer, April 1997, pp. 75-82.
    • (1997) Computer , pp. 75-82
    • Hsueh, M.C.1    Tsai, T.K.2    Iyer, R.K.3
  • 6
    • 84936893976 scopus 로고
    • Using heavy-ion radiation to validate fault-handling mechanisms
    • J. Karlsson, P. Liden, P. Dahlgren, R. Johansson, U. Gunneflo, Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms, IEEE Micro, Vol. 14, No. 1, pp. 8-32, 1994
    • (1994) IEEE Micro , vol.14 , Issue.1 , pp. 8-32
    • Karlsson, J.1    Liden, P.2    Dahlgren, P.3    Johansson, R.4    Gunneflo, U.5
  • 7
    • 84881226245 scopus 로고    scopus 로고
    • Fault injection into vhdl models: Experimental validation of a fault tolerant microcomputer system
    • September
    • D. Gil, R. Martinez, J. V. Busquets, J. C. Baraza, P. J. Gil, Fault Injection into VHDL Models: Experimental Validation of a Fault Tolerant Microcomputer System, Dependable Computing EDCC-3, September 1999, pp. 191-208
    • (1999) Dependable Computing EDCC , vol.3 , pp. 191-208
    • Gil, D.1    Martinez, R.2    Busquets, J.V.3    Baraza, J.C.4    Gil, P.J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.