Evaluating the fault tolerance capabilities of embedded systems via BDM

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 452-457

  Rebaudengo, M ^a   Reorda, M Sonza ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; EFFICIENCY; FAULT TREE ANALYSIS; MICROCONTROLLERS; MICROPROCESSOR CHIPS; RELIABILITY;

BACKGROUND DIAGNOSTIC MODE; FAULT INJECTION; FAULT TOLERANCE; FLEXIBILITY; TIME EFFICIENCY;

EMBEDDED SYSTEMS;

EID: 0032637390     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)