The properties of radio frequency sputtered transparent and conducting ZnO:F films on polyethylene naphthalate substrate

Thin Solid Films

Volumn 519, Issue 6, 2011, Pages 1809-1816

  Bowen, A ^a   Li, J ^a   Lewis, J ^b   Sivaramakrishnan, K ^c   Alford, T L ^c   Iyer, S ^a  

^a North Carolina Agricultural and Technical State University   (United States)

^b RTI INTERNATIONAL   (United States)

^c Arizona State University   (United States)

Author keywords

Electrical properties and measurements; Flexible electronics; Optical properties; Polyethylene naphthalate; Rutherford Backscattering Spectroscopy; Sputtering; Thin films; Transparent conducting oxide; Zinc Oxide; ZnO:F

Indexed keywords

ELECTRICAL PROPERTIES AND MEASUREMENTS; POLYETHYLENE NAPHTHALATE; RUTHERFORD BACK-SCATTERING; TRANSPARENT CONDUCTING OXIDE; ZNO;

ABSORPTION; BACKSCATTERING; CONDUCTIVE FILMS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; FLEXIBLE ELECTRONICS; GALVANOMAGNETIC EFFECTS; HALL MOBILITY; OPTICAL PROPERTIES; ORGANIC LIGHT EMITTING DIODES (OLED); POLYETHYLENES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; THERMOPLASTICS; THIN FILMS; ZINC; ZINC OXIDE;

OXIDE FILMS;

EID: 78651244714     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.10.019     Document Type: Article

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