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Journal of Physics D: Applied Physics

Volumn 34, Issue 21, 2001, Pages 3097-3108

Resistivity of polycrystalline zinc oxide films: Current status and physical limit

(1) Ellmer, K a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; CHARGE CARRIERS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON MOBILITY; ENERGY GAP; HOLE MOBILITY; MAGNETRON SPUTTERING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PULSED LASER APPLICATIONS; ZINC OXIDE;

HALL MOBILITIES; POLYCRYSTALLINE ZINC OXIDE FILMS;

SEMICONDUCTING FILMS;

EID: 0035824090 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/21/301 Document Type: Article

Times cited : (750)

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