Effect of mechanical and electromechanical stress on a-ZIO TFTs

IEEE Electron Device Letters

Volumn 31, Issue 12, 2010, Pages 1416-1418

  Dey, Aritra ^a   Indluru, Anil ^a   Venugopal, Sameer M ^b   Allee, David R ^a   Alford, Terry L ^a  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Polyethylene napthalate (PEN); thin film transistor (TFT); uniaxial; zinc indium oxide (ZIO)

Indexed keywords

CHANNEL LENGTH; CONDUCTING CHANNELS; CYLINDRICAL SURFACE; ELECTROMECHANICAL STRESS; EXPERIMENTAL ERRORS; ISLAND STRUCTURE; MECHANICAL STRAIN; POLYETHYLENE NAPTHALATE; SUBTHRESHOLD SLOPE; TIME DURATION; TIME SPAN; UNIAXIAL; ZINC INDIUM OXIDE (ZIO);

AMORPHOUS FILMS; COMPRESSIVE STRESS; INDIUM; POLYETHYLENES; SEMICONDUCTING ORGANIC COMPOUNDS; TENSILE STRESS; THERMOPLASTICS; ZINC;

THIN FILM TRANSISTORS;

EID: 78649446473     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2010.2080350     Document Type: Article

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