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Volumn 79, Issue 20, 2001, Pages 3347-3349
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Electron mobility in amorphous silicon thin-film transistors under compressive strain
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035851452
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1418254 Document Type: Article |
Times cited : (57)
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References (17)
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