Failure resistance of amorphous silicon transistors under extreme in-plane strain

Applied Physics Letters

Volumn 75, Issue 19, 1999, Pages 3011-3013

  Gleskova, H ^a   Wagner, S ^a   Suo, Z ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000180678     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125174     Document Type: Article

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