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Volumn 10, Issue 11, 2010, Pages 4429-4434

Ultradense, deep subwavelength nanowire array photovoltaics as engineered optical thin films

Author keywords

birefringence; nanowire; photovoltaic; Silicon

Indexed keywords

ABSORPTANCE; BIREFRINGENT MATERIALS; DEVICE FEATURES; DIELECTRIC FUNCTIONS; NANOWIRE ARRAYS; OPTICAL THIN FILMS; PHOTOCURRENT MEASUREMENT; PHOTOVOLTAIC; PHOTOVOLTAIC DEVICES; PHOTOVOLTAICS; PHYSICAL MODEL; RIGOROUS COUPLED WAVE ANALYSIS; SILICON NANOWIRES; SUB-WAVELENGTH; ULTRADENSE;

EID: 78449286229     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl102199b     Document Type: Article
Times cited : (12)

References (31)
  • 25
    • 78449285665 scopus 로고    scopus 로고
    • MRCWA - Multilayer Rigorous Coupled Wave Analysis Home Page. (accessed May 15)
    • Rathgen, H. MRCWA-Multilayer Rigorous Coupled Wave Analysis Home Page. http://mrcwa.sourceforge.net/ (accessed May 15, 2010).
    • (2010)
    • Rathgen, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.