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Volumn 6, Issue , 2008, Pages 111-114
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Development of stage-scanning system for confocal scanning transmission electron microscopy
c
NONE
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Author keywords
Confocal imaging; Piezo driven specimen stage; Scanning transmission electron microscopy; Stage scanning system
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Indexed keywords
ELECTRONS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
IMAGING SYSTEMS;
SCANNING;
TRANSMISSION ELECTRON MICROSCOPY;
ATOMIC RESOLUTION;
BEAM SCANNING SYSTEMS;
CONFOCAL IMAGING;
CONFOCAL SCANNING;
PIEZO-DRIVEN SPECIMEN STAGE;
PIEZO-DRIVEN STAGES;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
STAGE-SCANNING SYSTEM;
SCANNING ELECTRON MICROSCOPY;
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EID: 45949092926
PISSN: None
EISSN: 13480391
Source Type: Journal
DOI: 10.1380/ejssnt.2008.111 Document Type: Conference Paper |
Times cited : (9)
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References (12)
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