Three-dimensional optical sectioning by scanning confocal electron microscopy with a stage-scanning system

Microscopy and Microanalysis

Volumn 16, Issue 3, 2010, Pages 233-238

  Hashimoto, Ayako ^a   Shimojo, Masayuki ^a,b   Mitsuishi, Kazutaka ^a   Takeguchi, Masaki ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

annular dark field imaging; nanoparticles; optical sectioning; scanning confocal electron microscopy; stage scanning; three dimensional imaging

Indexed keywords

EID: 77957238323     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610000127     Document Type: Article

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