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Journal of Applied Physics

Volumn 108, Issue 7, 2010, Pages

Leakage mechanism of Ba0.8Sr0.2TiO 3/ZrO2 multilayer thin films

(6) Sahoo, S K a,b,c Misra, D b Agrawal, D C d Mohapatra, Y N d Majumder, S B e Katiyar, R S f

a STATE UNIVERSITY OF NEW YORK (United States)

b NEW JERSEY INSTITUTE OF TECHNOLOGY (United States)

c NATIONAL RENEWABLE ENERGY LABORATORY (United States)

d INDIAN INSTITUTE OF TECHNOLOGY KANPUR (India)

e INDIAN INSTITUTE OF TECHNOLOGY (India)

f UNIVERSITY OF PUERTO RICO (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT BEHAVIORS; DIFFERENT STRUCTURE; DOMINANT MECHANISM; FIELD DEPENDENCE; HIGH-FIELD REGIONS; IV CHARACTERISTICS; LEAKAGE MECHANISM; MULTI-LAYER THIN FILM; POOLE-FRENKEL MECHANISMS; POOLE-FRENKEL MODEL; SI SUBSTRATES; SPACE CHARGE LIMITED CURRENTS; TEMPERATURE RANGE; TIO; TRAP LEVELS;

BARIUM; ELECTRIC FIELDS; FILM PREPARATION; MULTILAYER FILMS; VAPOR DEPOSITION; ZIRCONIUM ALLOYS;

MULTILAYERS;

EID: 77958156337 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3490187 Document Type: Article

Times cited : (38)

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