Leakage mechanism of (Ba0.7Sr0.3)TiO3 thin films in the low-temperature range

Applied Physics Letters

Volumn 81, Issue 25, 2002, Pages 4817-4819

  Yang, Hao ^a   Tao, Kun ^a   Chen, Bin ^a   Qiu, Xianggang ^a   Xu, Bo ^a   Zhao, Bairu ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRODES; INTERFACES (MATERIALS); LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES; YTTRIUM BARIUM COPPER OXIDES;

VOLTAGE POLARITY;

THIN FILMS;

EID: 0037449309     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1529087     Document Type: Article

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