Electronic defect and trap-related current of (Ba0.4Sr0.6)TiO3 thin films

Journal of Applied Physics

Volumn 81, Issue 10, 1997, Pages 6762-6766

  Wang, Yin Pin ^a   Tseng, Tseung Yuen ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346502306     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365218     Document Type: Article

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