Substantial reduction of the dielectric losses of Ba0.6Sr 0.4TiO3 thin films using a SiO2 barrier layer

Journal of Physics Condensed Matter

Volumn 16, Issue 50, 2004, Pages 9155-9162

  Reymond, V ^a   Michau, D ^a   Payan, S ^a   Maglione, M ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; DIELECTRIC LOSSES; FERROELECTRIC THIN FILMS; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; NATURAL FREQUENCIES; PERMITTIVITY; RAPID THERMAL ANNEALING; SILICA;

COMPOSITE STACKS; DIELECTRIC SUSCEPTIBILITY; FREQUENCY RANGE; RADIO-FREQUENCY AGILE DEVICES;

BARIUM COMPOUNDS;

EID: 10944223453     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/50/006     Document Type: Article

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