Changes in the leakage currents in Ba0.8 Sr0.2 Ti O3 Zr O2 multilayers due to modulations in oxygen concentration

Applied Physics Letters

Volumn 85, Issue 21, 2004, Pages 5001-5003

  Sahoo, S K ^a,b   Agrawal, D C ^a,b   Mohapatra, Y N ^a,b   Majumder, Subhasish B ^a,b   Katiyar, Ram S ^a,b  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; DIELECTRIC MATERIALS; DIFFUSION; LEAKAGE CURRENTS; MATHEMATICAL MODELS; MULTILAYERS; OPTIMIZATION; OXYGEN; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARGED OXYGEN VACANCIES; DIELECTRIC THIN FILMS; OXYGEN CONCENTRATIONS; TRANSITION FIELDS;

THIN FILMS;

EID: 19144371561     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1825074     Document Type: Article

References (14)

1. H. Schroeder, S. Schmitz, and P. Meuffels, Appl. Phys. Lett. 82, 781 (2003).
2. C. L. Chen, H. H. Feng, Z. Zhang, A. Brazdeikis, Z. J. Huang, W. K. Chu, F. A. Miranda, F. W. Van Keuls, R. R. Romanofsky, and Y. Liou, Appl. Phys. Lett. 75, 412 (1999).
3. B. Panda, A. Dhar, G. D. Nigam, D. Bhattacharya, and S. K. Ray, Thin Solid Films 332, 46 (1998).
4. S. Agarwal, G. L. Sharma, and R. Manchanda, Solid State Commun. 119, 681 (2001).
5. F. Yan, Y. Wang, H. L. W. Chan, and C. L. Choy, Appl. Phys. Lett. 82, 4325 (2003).
6. W. Choi and T. Sands, J. Appl. Phys. 93, 4761 (2003).
7. M. Jain, S. B. Majumder, R. S. Katiyar, and A. S. Bhalla, Thin Solid Films 447, 537 (2004).
8. K. H. Yoon, J. C. Lee, J. Park, D. H. Kang, C. M. Song, and Y. G. Seo, Jpn. J. Appl. Phys., Part 1 40, 5497 (2001).
9. C. Wang, Q. F. Fang, Z. G. Zhu, A. Q. Jiang, S. Y. Wang, B. L. Cheng, and Z. H. Chen, Appl. Phys. Lett. 82, 2880 (2003).
10. J. G. Cheng, X. J. Meng, B. Li, J. Tang, S. L. Guo, and J. H. Chu, Appl. Phys. Lett. 75, 2132 (1999).
11. R. C. Garvie, J. Phys. Chem. 69, 123 (1965).
12. B. D. Cullity, Elements of X-Ray Diffraction, 2nd ed. (Addison-Wesley, Reading, MA, 1976).
13. Y. B. Lin and J. Y. Lee, J. Appl. Phys. 87, 1841 (2000).
14. S. Jang and H. M. Jang, Ceram. Int. 26, 421 (2000).