A new scanning method for fast atomic force microscopy

IEEE Transactions on Nanotechnology

Volumn 10, Issue 2, 2011, Pages 203-216

  Mahmood, Iskandar A ^a   Moheimani, S O Reza ^a   Bhikkaji, Bharath ^b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Atomic force microscopy; feedback control; high speed scanning; spiral scanning; tracking

Indexed keywords

3-D IMAGE; AFM; ATOMIC FORCE MICROSCOPES; CONSTANT ANGULAR VELOCITY; CONSTANT LINEAR VELOCITIES; HIGH DEGREE OF ACCURACY; HIGH QUALITY IMAGES; HIGH-SPEED SCANNING; INPUT SIGNAL; MATERIAL SURFACE; MECHANICAL RESONANCE; NANO SCALE; NANO-POSITIONER; NANOTECHNOLOGY RESEARCH; RASTER SCANS; SCAN METHODS; SCANNING METHODS; SET-POINT; SINGLE-FREQUENCY; SLOWLY VARYING AMPLITUDES; SPIRAL PATTERN; SPIRAL SCAN; SPIRAL SCANNING; SPIRAL TRAJECTORIES; TRACKING;

ATOMIC FORCE MICROSCOPY; FEEDBACK CONTROL; NANOTECHNOLOGY; OPTICAL KERR EFFECT; SCANNING;

THREE DIMENSIONAL;

EID: 77957837915     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2009.2036844     Document Type: Article

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