Charge drives for scanning probe microscope positioning stages

Ultramicroscopy

Volumn 108, Issue 12, 2008, Pages 1551-1557

  Fleming, A J ^a   Leang, K K ^b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b University of Nevada   (United States)

Author keywords

Atomic force microscopy (AFM); Scanning tunneling microscopy (STM); Tip scanning instrument design and characterization

Indexed keywords

CLOSED LOOP CONTROL SYSTEMS; ELASTICITY; FEEDBACK; HYSTERESIS; PIEZOELECTRIC ACTUATORS; SCANNING; SENSOR NETWORKS; SENSORS; SPEED; VOLTAGE REGULATORS;

ATOMIC FORCE MICROSCOPY (AFM); CLOSED LOOPS; CLOSED-LOOP CONTROLS; FEED-BACK SENSORS; HIGH-SPEED IMAGING; NON LINEARITIES; OPEN LOOPS; POSITION SENSORS; SCAN RANGE; SCANNING PROBE MICROSCOPE; SCANNING PROBE MICROSCOPES; SCANNING TUNNELING MICROSCOPY (STM); SENSOR NOISES; TIP SCANNING INSTRUMENT DESIGN AND CHARACTERIZATION; VOLTAGE AMPLIFIERS;

DRIVES;

AMPLIFIER; ARTICLE; ATOMIC FORCE MICROSCOPY; BIOSENSOR; FEEDBACK SYSTEM; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

EID: 53249121913     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.05.004     Document Type: Article

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