Spiral scanning: An alternative to conventional raster scanning in high-speed scanning probe microscopes

Proceedings of the 2010 American Control Conference, ACC 2010

Volumn , Issue , 2010, Pages 5757-5762

  Mahmood, I A ^a   Moheimani, S O R ^a  

^a UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; RASTERIZATION;

CALIBRATION GRATINGS; HIGH SPEED SCANNING; MECHANICAL RESONANCE; RASTER SCANNING; RESONANCE FREQUENCIES; SCANNING METHODS; SINGLE FREQUENCY; SLOWLY VARYING AMPLITUDES;

SCANNING;

EID: 77957836894     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/acc.2010.5530444     Document Type: Conference Paper

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