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Journal of Applied Physics

Volumn 108, Issue 6, 2010, Pages

Optical characterization of GaN/AlGaN bilayer by transmission and reflection spectra

(5) Li, Chao a,b Bao, Xichang a,b Xu, Jintong a,b Zhang, Yan a,b Li, Xiangyang a,b

a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS (China)

b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; BI-LAYER; EXTINCTION COEFFICIENTS; HALF-WAVE; INTERFERENCE FRINGE; OPTICAL CHARACTERISTICS; OPTICAL CHARACTERIZATION; OSCILLATION AMPLITUDE; REFLECTION CURVES; REFLECTION SPECTRA; ROOM TEMPERATURE; SAPPHIRE SUBSTRATES; TRANSMISSION SPECTRUMS; WURTZITE GAN;

ABSORPTION; ABSORPTION SPECTROSCOPY; DIAMOND FILMS; ENERGY GAP; GALLIUM ALLOYS; GALLIUM NITRIDE; ORGANIC POLYMERS; SOLIDS; ZINC SULFIDE;

PLASMA DIAGNOSTICS;

EID: 77957742239 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3483952 Document Type: Article

Times cited : (10)

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