Thermal exchange radius measurement: Application to nanowire thermal imaging

Review of Scientific Instruments

Volumn 81, Issue 7, 2010, Pages

  Puyoo, Etienne ^a,b   Grauby, St́phane ^a   Rampnoux, Jean Michel ^a   Rouvìre, Emmanuelle ^b   Dilhaire, Stefan ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRUCIAL PARAMETERS; EXPERIMENTAL PROCEDURE; PALLADIUM FILMS; RADIUS MEASUREMENTS; SCANNING THERMAL MICROSCOPY; SILICON NANOWIRES; SPATIAL RESOLUTION; THERMAL EXCHANGE; THERMAL IMAGING; THERMAL PROPERTIES;

IMAGE RESOLUTION; INFRARED IMAGING; NANOWIRES; PALLADIUM; SILICON COMPOUNDS; SILICON OXIDES; THERMODYNAMIC PROPERTIES;

PROBES;

EID: 77957139943     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3455214     Document Type: Article

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