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Volumn 38, Issue 1, 2005, Pages 69-75
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Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
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Author keywords
Microcooler; SThM technique; SThM thermal probe time response; Tip sample contact resistance; Wollaston wire
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Indexed keywords
FREQUENCIES;
HEAT RESISTANCE;
SCANNING ELECTRON MICROSCOPY;
TEMPERATURE DISTRIBUTION;
TRANSFER FUNCTIONS;
WIRE;
MICROCOOLER;
STHM TECHNIQUE;
STHM THERMAL PROBE TIME RESPONSE;
TIP-SAMPLE CONTACT RESISTANCE;
WOLLASTON WIRE;
SILICON COMPOUNDS;
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EID: 20644453752
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1016/j.spmi.2005.04.005 Document Type: Article |
Times cited : (13)
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References (15)
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