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Volumn 38, Issue 1, 2005, Pages 69-75

Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers

Author keywords

Microcooler; SThM technique; SThM thermal probe time response; Tip sample contact resistance; Wollaston wire

Indexed keywords

FREQUENCIES; HEAT RESISTANCE; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DISTRIBUTION; TRANSFER FUNCTIONS; WIRE;

EID: 20644453752     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2005.04.005     Document Type: Article
Times cited : (13)

References (15)
  • 1
    • 0000832716 scopus 로고
    • Thermal conductivity contrast imaging with a scanning thermal microscope
    • T.W. Tong Technomic Publishing Co. Lancaster
    • R.B. Dinwiddie, R.J. Pylkki, and P.E. West Thermal conductivity contrast imaging with a scanning thermal microscope T.W. Tong Thermal Conductivity vol. 22 1994 Technomic Publishing Co. Lancaster 668 677
    • (1994) Thermal Conductivity , vol.22 , pp. 668-677
    • Dinwiddie, R.B.1    Pylkki, R.J.2    West, P.E.3
  • 14
    • 20644445488 scopus 로고    scopus 로고
    • Ph.D. Thesis, Université Bordeaux 1
    • L.d. Patiño-Lopez, Ph.D. Thesis, Université Bordeaux 1, 2004
    • (2004)
    • Patiño-Lopez, L.D.1
  • 15
    • 20644450175 scopus 로고    scopus 로고
    • ®
    • ®


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.