One-dimensional hard x-ray field retrieval using a moveable structure

Optics Express

Volumn 18, Issue 17, 2010, Pages 18374-18382

  Guizar Sicairos, Manuel ^a,b   Evans Lutterodt, Kenneth ^c   Isakovic, Abdel F ^c,e   Stein, Aaron ^c   Warren, John B ^c   Sandy, Alec R ^d   Narayanan, Suresh ^d   Fienup, James R ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PROFILES; FAR-FIELD INTENSITY MEASUREMENTS; HARD X RAY; HARD X-RAY BEAMS; KINOFORM LENS; NARROWER BEAM; PHASE RETRIEVAL; SCAN MEASUREMENT; X-RAY LINES;

ALGORITHM; ARTICLE; IMAGE PROCESSING; INSTRUMENTATION; LASER; METHODOLOGY; RADIATION SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; X RAY;

ALGORITHMS; IMAGE PROCESSING, COMPUTER-ASSISTED; LASERS; MICROSCOPY, ELECTRON, TRANSMISSION; SCATTERING, RADIATION; ULTRAVIOLET RAYS; X-RAYS;

EID: 77956380824     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.018374     Document Type: Article

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