Strong light-matter coupling in bulk GaN-microcavities with double dielectric mirrors fabricated by two different methods

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Reveret F ^a,b   Bejtka, K ^c,d   Edwards, P R ^d   Chenot, S ^c   Sellers, I R ^c   Disseix, P ^a,b   Vasson, A ^a,b   Leymarie, J ^a,b   Duboz, J Y ^c   Leroux, M ^c   Semond, F ^c   Martin, R W ^d  

^a UNIVERSITÉ CLERMONT AUVERGNE   (France)

^b CNRS   (France)

^c CRHEA CNRS   (France)

^d UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; ANGLE-DEPENDENT; BRAGG MIRRORS; CRACK FREE; DIELECTRIC MIRRORS; GAN LAYERS; HIGH DEFECT DENSITIES; LIGHT-MATTER COUPLING; LOW TEMPERATURES; REFLECTIVITY SPECTRA; ROOM TEMPERATURE; SELECTIVE ETCHING; SI SUBSTRATES; STRONG-COUPLING REGIME; TRANSFER-MATRIX CALCULATIONS; TRANSMISSION EXPERIMENTS;

DEFECT DENSITY; EPITAXIAL GROWTH; GALLIUM NITRIDE; MICROCAVITIES; MIRRORS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; OPTICAL PROPERTIES; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; TRANSFER MATRIX METHOD;

GALLIUM ALLOYS;

EID: 77956337760     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3477450     Document Type: Conference Paper

References (27)

1. N. Antoine-Vincent, F. Natali, D. Byrne, A. Vasson, P. Disseix, J. Leymarie, M. Leroux, F. Semond, and J. Massies, Phys. Rev. B PLRBAQ 0556-2805 68, 153313 (2003). 10.1103/PhysRevB.68.153313
2. F. Semond, I. R. Sellers, F. Natali, D. Byrne, M. Leroux, J. Massies, N. Ollier, J. Leymarie, P. Disseix, and A. Vasson, Appl. Phys. Lett. APPLAB 0003-6951 87, 021102 (2005). 10.1063/1.1994954
3. I. R. Sellers, F. Semond, M. Leroux, J. Massies, P. Disseix, A. -L. Henneghien, J. Leymarie, and A. Vasson, Phys. Rev. B PLRBAQ 0556-2805 73, 033304 (2006). 10.1103/PhysRevB.73.033304
4. I. R. Sellers, F. Semond, M. Leroux, J. Massies, M. Zamfirescu, F. Stokker-Cheregi, M. Gurioli, A. Vinattieri, M. Colocci, A. Tahraoui, and A. A. Khalifa, Phys. Rev. B PLRBAQ 0556-2805 74, 193308 (2006). 10.1103/PhysRevB.74. 193308
5. A. Alyamani, D. Sanvitto, A. A. Khalifa, M. S. Skolnick, T. Wang, F. Ranalli, P. J. Parbrook, A. Tahraoui, and R. Airey, J. Appl. Phys. JAPIAU 0021-8979 101, 093110 (2007). 10.1063/1.2728744
6. J. -F. Carlin, J. Dorsaz, E. Feltin, R. Butt́, N. Grandjean, M. Ilegems, and M. Laügt, Appl. Phys. Lett. APPLAB 0003-6951 86, 031107 (2005). 10.1063/1.1849851
7. R. Butt́, G. Christmann, E. Feltin, J. -F. Carlin, M. Mosca, M. Ilegems, and N. Grandjean, Phys. Rev. B PLRBAQ 0556-2805 73, 033315 (2006). 10.1103/PhysRevB.73.033315
8. G. Christmann, R. Butt́, E. Feltin, J. -F. Carlin, and N. Grandjean, Phys. Rev. B PLRBAQ 0556-2805 73, 153305 (2006). 10.1103/PhysRevB.73. 153305
9. S. Christopoulos, G. Baldassarri Höger von Högersthal, A. Grundy, P. G. Lagoudakis, A. V. Kavokin, J. J. Baumberg, G. Christmann, R. Butt́, E. Feltin, J. -F. Carlin, and N. Grandjean, Phys. Rev. Lett. PRLTAO 0031-9007 98, 126405 (2007). 10.1103/PhysRevLett.98.126405
10. E. Feltin, G. Christmann, J. Dorsaz, A. Castiglia, J. -F. Carlin, R. Butte, N. Grandjean, S. Christopoulos, G. Baldassarri Höger von Högersthal, A. J. D. Grundy, P. G. Lagoudakis, and J. J. Baumberg, Electron. Lett. ELLEAK 0013-5194 43, 924 (2007). 10.1049/el:20071226
11. K. Bejtka, F. Ŕveret, R. W. Martin, P. R. Edwards, A. Vasson, J. Leymarie, I. R. Sellers, J. Y. Duboz, M. Leroux, and F. Semond, Appl. Phys. Lett. APPLAB 0003-6951 92, 241105 (2008). 10.1063/1.2944263
12. H. Benisty, H. De Neve, and C. Weisbuch, IEEE J. Quantum Electron. IEJQA7 0018-9197 34, 1612 (1998). 10.1109/3.709578
13. Y. K. Song, H. Zhou, M. Diagne, A. V. Nurmikko, R. P. Schneider, Jr., C. P. Kuo, M. R. Krames, R. S. Kern, C. Carter-Coman, and F. A. Kish, Appl. Phys. Lett. APPLAB 0003-6951 76, 1662 (2000). 10.1063/1.126128
14. R. W. Martin, P. R. Edwards, H. -S. Kim, K. -S. Kim, T. Kim, I. M. Watson, M. D. Dawson, Y. Cho, T. Sands, and N. W. Cheung, Appl. Phys. Lett. APPLAB 0003-6951 79, 3029 (2001). 10.1063/1.1415769
15. T. Tawara, H. Gotoh, T. Akasaka, N. Kobayashi, and T. Saitoh, Appl. Phys. Lett. APPLAB 0003-6951 83, 830 (2003). 10.1063/1.1596728
16. T. K. Kim, S. S. Yang, J. K. Hong, and G. M. Yang, Appl. Phys. Lett. APPLAB 0003-6951 89, 041129 (2006). 10.1063/1.2236223
17. F. Rizzi, P. R. Edwards, K. Bejtka, F. Semond, X. N. Kang, G. Y. Zhang, E. Gu, M. D. Dawson, I. M. Watson, and R. W. Martin, Appl. Phys. Lett. APPLAB 0003-6951 90, 111112 (2007). 10.1063/1.2712786
18. K. Bejtka, P. R. Edwards, R. W. Martin, F. Ŕveret, A. Vasson, J. Leymarie, I. R. Sellers, M. Leroux, and F. Semond, Semicond. Sci. Technol. SSTEET 0268-1242 23, 045008 (2008). 10.1088/0268-1242/23/4/045008
19. R. W. Martin, P. R. Edwards, K. P. O'Donnell, M. D. Dawson, C. -W. Jeon, C. Liu, G. R. Rice, and I. M. Watson, Phys. Status Solidi A PSSABA 0031-8965 201, 665 (2004). 10.1002/pssa.200304089
20. F. Semond, Y. Cordier, N. Grandjean, F. Natali, B. Damilano, S. V́zian, and J. Massies, Phys. Status Solidi A PSSABA 0031-8965 188, 501 (2001). 10.1002/1521-396X(200112)188:2<501::AID-PSSA5013.0.CO;2-6
21. F. Ŕveret, P. Disseix, J. Leymarie, A. Vasson, F. Semond, M. Leroux, and J. Massies, Phys. Rev. B PLRBAQ 0556-2805 77, 195303 (2008). 10.1103/PhysRevB.77.195303
22. O. Aoud́, P. Disseix, J. Leymarie, A. Vasson, M. Leroux, E. Aujol, B. Beaumont, A. Trassoudaine, and Y. Andŕ, Phys. Rev. B PLRBAQ 0556-2805 77, 045206 (2008). 10.1103/PhysRevB.77.045206
23. R. P. Stanley, R. Houdŕ, C. Weisbuch, U. Oesterle, and M. Ilegems, Phys. Rev. B PLRBAQ 0556-2805 53, 10995 (1996). 10.1103/PhysRevB.53.10995
24. C. Ell, J. Prineas, T. R. Nelson, Jr., S. Park, H. M. Gibbs, G. Khitrova, S. W. Koch, and R. Houdŕ, Phys. Rev. Lett. PRLTAO 0031-9007 80, 4795 (1998). 10.1103/PhysRevLett.80.4795
25. R. Houdŕ, R. P. Stanley, and M. Ilegems, Phys. Rev. A PLRAAN 1050-2947 53, 2711 (1996). 10.1103/PhysRevA.53.2711
26. F. Ŕveret, P. Disseix, J. Leymarie, A. Vasson, F. Semond, M. Leroux, and J. Massies, Solid State Commun. SSCOA4 0038-1098 150, 122 (2010). 10.1016/j.ssc.2009.09.036
27. D. Solnyshkov and G. Malpuech, Superlattices Microstruct. SUMIEK 0749-6036 41, 279 (2007). 10.1016/j.spmi.2007.03.013