Hardware that produces bounded rather than exact results

Proceedings - Design Automation Conference

Volumn , Issue , 2010, Pages 871-876

  Breuer, Melvin ^a  

^a University of Southern California   (United States)

Author keywords

CMOS; Computational fabrics; Error rate; Error tolerance; Performance degradation

Indexed keywords

BOOLEAN OPERATIONS; CMOS; CMOS CIRCUITS; COMPUTATIONAL FABRICS; DEFECTS AND IMPURITIES; ERROR-TOLERANCE; EXACT RESULTS; MARKET SYSTEM; MATHEMATICAL ANALYSIS; NEW FORMS; PERFORMANCE DEGRADATION; PROCESS VARIATION; QUANTUM DEVICE; TECHNOLOGICAL REVOLUTION;

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; FABRICS; IMPURITIES;

DEGRADATION;

EID: 77956220267     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837493     Document Type: Conference Paper

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