Tolerance of performance degrading faults for effective yield improvement

Proceedings - International Test Conference

Volumn , Issue , 2009, Pages

  Hsieh, Tong Yu ^a   Breuer, Melvin A ^b   Annavaram, Murali ^b   Gupta, Sandeep K ^b   Lee, Kuen Jong ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b University of Southern California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRANCH PREDICTION; CLOCK FREQUENCY; CURRENT PRACTICES; FUNCTIONAL ERRORS; NANO-SCALE FABRICATION; PERFORMANCE DEGRADATION; POTENTIAL BENEFITS; STUCK-AT FAULTS; SYSTEM OUTPUT; SYSTEM PERFORMANCE DEGRADATION; USER PROGRAMS; YIELD IMPROVEMENT;

DEGRADATION;

EID: 76549124009     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2009.5355594     Document Type: Conference Paper

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