Estimating error rate during self-test via one's counting

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Shahidi, Shideh ^a   Gupta, Sandeep K ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; DIGITAL COMMUNICATION SYSTEMS; ECONOMIC ANALYSIS; PARAMETER ESTIMATION; PROBLEM SOLVING; SYSTEMS SCIENCE;

CIRCUIT UNDER TEST (CUT); ERROR RATES; SELF-TEST APPROACH; SYSTEM OPERATIONS;

ERROR DETECTION;

EID: 39749199479     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297636     Document Type: Conference Paper

References (12)