Modeling, analysis, and self-management of electronic textiles

IEEE Transactions on Computers

Volumn 52, Issue 8, 2003, Pages 996-1010

  Stanley Marbell, Phillip ^a   Marculescu, Diana ^a   Marculescu, Radu ^a   Khosla, Pradeep K ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Application remapping; Code migration; Electronic textiles; Fault tolerance; Remote execution; Sensor networks; Wearable computing

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; ELECTRIC POWER SUPPLIES TO APPARATUS; FAULT TOLERANT COMPUTER SYSTEMS; INFORMATION TECHNOLOGY; INTELLIGENT MATERIALS; INTERCONNECTION NETWORKS; MATHEMATICAL MODELS; TELECOMMUNICATION LINKS; WEARABLE COMPUTERS;

CODE MIGRATION; COMPUTATIONAL FABRICS; ELECTRONIC TEXTILES; INTERCONNECTION LINKS; REMOTE EXECUTION;

EMBEDDED SYSTEMS;

EID: 0042564699     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2003.1223635     Document Type: Article

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