Multi-vector tests: A path to perfect error-rate testing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 1178-1183

  Shahidi, Shideh ^a   Gupta, Sandeep ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUITS; ERROR RATE; ERROR TOLERANCE; TEST SETS; UNIVERSAL BOUNDS; UPPER BOUNDS;

BENCHMARKING; INDUSTRIAL ENGINEERING; LEARNING SYSTEMS; NETWORKS (CIRCUITS); TESTING; VECTORS;

ERROR ANALYSIS;

EID: 49749128741     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484838     Document Type: Conference Paper

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