A theory of error-rate testing

IEEE International Conference on Computer Design, ICCD 2006

Volumn , Issue , 2006, Pages 438-445

  Shahidi, Shideh ^a   Gupta, Sandeep K ^a  

^a University of Southern California   (United States)

Author keywords

ATPG; Error rate; Error tolerance; Intelligible testing; Test generation

Indexed keywords

ATPG; COMPLEX GATES; COMPUTER DESIGNS; DIGITAL COMMUNICATIONS; EMPIRICAL DATA; ERROR RATE; ERROR RATES; ERROR TOLERANCE; ERROR-FREE OPERATIONS; ERROR-TOLERANT; FAULT EQUIVALENCE; INTELLIGIBLE TESTING; INTERNATIONAL CONFERENCES; NEW CONCEPT; TEST GENERATION; TEST GENERATION PROCEDURE; TEST GENERATOR;

CHLORINE COMPOUNDS; COMPUTER GRAPHICS; DIGITAL COMMUNICATION SYSTEMS; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK ANALYSIS; LEARNING SYSTEMS; TELECOMMUNICATION; TESTING; VECTORS;

ERROR ANALYSIS;

EID: 49749119532     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2006.4380853     Document Type: Conference Paper

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