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Volumn 97, Issue 3, 2010, Pages

Electron and hole-related luminescence processes in gate injection transistors

Author keywords

[No Author keywords available]

Indexed keywords

GATE DRAIN; GATE INJECTION; GATE VOLTAGES; LUMINESCENCE PROCESS; LUMINESCENCE SIGNALS; MEASUREMENT RESULTS; OPTICAL MEASUREMENT;

ELECTRIC FIELDS; GALLIUM ALLOYS; GALLIUM NITRIDE; HOT ELECTRONS; OPTICAL DATA PROCESSING;

LUMINESCENCE;

EID: 77956197355 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3467039 Document Type: Article

Times cited : (31)

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