Electron holography on beam sensitive materials: Organic polymers and mesoporous silica

Chemistry of Materials

Volumn 14, Issue 4, 2002, Pages 1505-1514

  Simon, Paul ^a   Huhle, Ralf ^a   Lehmann, Michael ^a   Lichte, Hannes ^a   Mönter, Damian ^a   Bieber, Thomas ^a   Reschetilowski, Wladimir ^a   Adhikari, Rameshwar ^b   Michler, Goerg H ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; CHEMICAL ANALYSIS; DIFFRACTION; ELECTRON MICROSCOPY; HOLOGRAPHY; IMAGE ANALYSIS; PARTICULATE MATTER; POROSITY; RADIATION SCATTERING; STRUCTURE ANALYSIS;

EID: 0036123903     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm011140q     Document Type: Article

References (33)

1. New mesoporous titano-silicate molecular sieve
2. Electron microscopy