Stress-induced chemical detection using flexible metal-organic frameworks

Journal of the American Chemical Society

Volumn 130, Issue 44, 2008, Pages 14404-14405

  Allendorf, Mark D ^a   Houk, Ronald J T ^a   Andruszkiewicz, Leanne ^b   Talin, A Alec ^a   Pikarsky, Joel ^b   Choudhury, Arnab ^b   Gall, Kenneth A ^b   Hesketh, Peter J ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; CUPRIC ION;

ANALYTICAL EQUIPMENT; ARTICLE; CHEMICAL DETECTION; METAL ORGANIC FRAMEWORK; MONITORING; STRESS;

EID: 55549097490     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja805235k     Document Type: Article

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