-
1
-
-
34547193872
-
30-nm-Gate AlGaN/GaN heterostructure field-effect transistors with a current-gain cutoff frequency of 181 GHz
-
DOI 10.1143/JJAP.45.L1111
-
M. Higashiwaki, T. Mimura, and T. Matsui, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 45, L1111 (2006). 10.1143/JJAP.45.L1111 (Pubitemid 47434506)
-
(2006)
Japanese Journal of Applied Physics, Part 2: Letters
, vol.45
, Issue.42-45
-
-
Higashiwaki, M.1
Mimura, T.2
Matsui, T.3
-
2
-
-
77949307075
-
-
SSELA5 0038-1101,. 10.1016/j.sse.2010.02.001
-
H. -K. Lin, F. -H. Huang, H. -L. Yu, Solid-State Electron. SSELA5 0038-1101 54, 582 (2010). 10.1016/j.sse.2010.02.001
-
(2010)
Solid-State Electron.
, vol.54
, pp. 582
-
-
Lin, H.-K.1
Huang, F.-H.2
Yu, H.-L.3
-
3
-
-
0035920698
-
-
APPLAB 0003-6951,. 10.1063/1.1398332
-
N. Shigekawa, K. Shiojima, and T. Suemitsu, Appl. Phys. Lett. APPLAB 0003-6951 79, 1196 (2001). 10.1063/1.1398332
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1196
-
-
Shigekawa, N.1
Shiojima, K.2
Suemitsu, T.3
-
4
-
-
0036639037
-
Optical study of high-biased AlGaN/GaN high-electron-mobility transistors
-
DOI 10.1063/1.1481973
-
N. Shigekawa, K. Shiojima, and T. Suemitsu, J. Appl. Phys. JAPIAU 0021-8979 92, 531 (2002). 10.1063/1.1481973 (Pubitemid 34783350)
-
(2002)
Journal of Applied Physics
, vol.92
, Issue.1
, pp. 531
-
-
Shigekawa, N.1
Shiojima, K.2
Suemitsu, T.3
-
5
-
-
34548734749
-
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC
-
DOI 10.1016/j.microrel.2007.07.085, PII S0026271407003551
-
M. Bouya, D. Carisetti, N. Malbert, N. Labat, P. Perdu, J. C. Clement, M. Bonnet, and G. Pataut, Microelectron. Reliab. MCRLAS 0026-2714 47, 1630 (2007). 10.1016/j.microrel.2007.07.085 (Pubitemid 47432680)
-
(2007)
Microelectronics Reliability
, vol.47
, Issue.9-11 SPEC. ISS.
, pp. 1630-1633
-
-
Bouya, M.1
Carisetti, D.2
Malbert, N.3
Labat, N.4
Perdu, P.5
Clement, J.C.6
Bonnet, M.7
Pataut, G.8
-
6
-
-
59649123041
-
-
ITDMA2 1530-4388,. 10.1109/TDMR.2008.923743
-
G. Meneghesso, G. Verzellesi, F. Danesin, F. Rampazzo, F. Zanon, A. Tazzoli, M. Meneghini, and E. Zanoni, IEEE Trans. Device Mater. Reliab. ITDMA2 1530-4388 8, 332 (2008). 10.1109/TDMR.2008.923743
-
(2008)
IEEE Trans. Device Mater. Reliab.
, vol.8
, pp. 332
-
-
Meneghesso, G.1
Verzellesi, G.2
Danesin, F.3
Rampazzo, F.4
Zanon, F.5
Tazzoli, A.6
Meneghini, M.7
Zanoni, E.8
-
7
-
-
67349100501
-
-
EDLEDZ 0741-3106,. 10.1109/LED.2009.2016440
-
E. Zanoni, F. Danesin, M. Meneghini, A. Cetronio, C. Lanzieri, M. Peroni, and G. Meneghesso, IEEE Electron Device Lett. EDLEDZ 0741-3106 30, 427 (2009). 10.1109/LED.2009.2016440
-
(2009)
IEEE Electron Device Lett.
, vol.30
, pp. 427
-
-
Zanoni, E.1
Danesin, F.2
Meneghini, M.3
Cetronio, A.4
Lanzieri, C.5
Peroni, M.6
Meneghesso, G.7
-
8
-
-
0001743471
-
-
10.1109/16.662779
-
L. Selmi, M. Mastrapasqua, D. M. Boulin, J. D. Bude, M. Pavesi, E. Sangiorgi, and M. R. Pinto, IEEE Transactions on Electron Devices 45, 802 (1998). 10.1109/16.662779
-
(1998)
IEEE Transactions on Electron Devices
, vol.45
, pp. 802
-
-
Selmi, L.1
Mastrapasqua, M.2
Boulin, D.M.3
Bude, J.D.4
Pavesi, M.5
Sangiorgi, E.6
Pinto, M.R.7
-
9
-
-
0029291996
-
-
10.1109/16.372081
-
G. Berthold, E. Zanoni, C. Canali, M. Pavesi, M. Pecchini, M. Manfredi, S. R. Bahl, and J. del Alamo, IEEE Transactions on Electron Devices 42, 752 (1995). 10.1109/16.372081
-
(1995)
IEEE Transactions on Electron Devices
, vol.42
, pp. 752
-
-
Berthold, G.1
Zanoni, E.2
Canali, C.3
Pavesi, M.4
Pecchini, M.5
Manfredi, M.6
Bahl, S.R.7
Del Alamo, J.8
-
10
-
-
29244446293
-
Field-plate engineering for HFETs
-
DOI 10.1109/TED.2005.859568
-
S. Karmalkar, M. S. Shur, G. Simin, and M. A. Khan, IEEE Trans. Electron Devices IETDAI 0018-9383 52, 2534 (2005). 10.1109/TED.2005.859568 (Pubitemid 41824832)
-
(2005)
IEEE Transactions on Electron Devices
, vol.52
, Issue.12
, pp. 2534-2540
-
-
Karmalkar, S.1
Shur, M.S.2
Simin, G.3
Khan, M.A.4
-
11
-
-
0029403829
-
-
EDLEDZ 0741-3106,. 10.1109/55.468285
-
N. Shigekawa, T. Enoki, T. Furuta, and H. Ito, IEEE Electron Device Lett. EDLEDZ 0741-3106 16, 515 (1995). 10.1109/55.468285
-
(1995)
IEEE Electron Device Lett.
, vol.16
, pp. 515
-
-
Shigekawa, N.1
Enoki, T.2
Furuta, T.3
Ito, H.4
-
12
-
-
36149012386
-
-
PHRVAO 0031-899X,. 10.1103/PhysRev.109.1537
-
A. G. Chynoweth, Phys. Rev. PHRVAO 0031-899X 109, 1537 (1958). 10.1103/PhysRev.109.1537
-
(1958)
Phys. Rev.
, vol.109
, pp. 1537
-
-
Chynoweth, A.G.1
-
14
-
-
68249096975
-
-
APPLAB 0003-6951,. 10.1063/1.3187540
-
D. G. Zhao, D. S. Jiang, J. J. Zhu, Z. S. Liu, H. Wang, S. M. Zhang, Y. T. Wang, and H. Yang, Appl. Phys. Lett. APPLAB 0003-6951 95, 041901 (2009). 10.1063/1.3187540
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 041901
-
-
Zhao, D.G.1
Jiang, D.S.2
Zhu, J.J.3
Liu, Z.S.4
Wang, H.5
Zhang, S.M.6
Wang, Y.T.7
Yang, H.8
-
15
-
-
0642306276
-
-
PLRBAQ 0556-2805,. 10.1103/PhysRevB.55.4689
-
E. Calleja, F. J. Sanchez, D. Basak, M. A. Sanchez-Garcia, E. Munoz, I. Izpura, F. Calle, J. M. G. Tijero, J. L. Sanchez-Rojas, B. Beaumont, P. Lorenzini, and P. Gibart, Phys. Rev. B PLRBAQ 0556-2805 55, 4689 1997. 10.1103/PhysRevB.55.4689
-
(1997)
Phys. Rev. B
, vol.55
, pp. 4689
-
-
Calleja, E.1
Sanchez, F.J.2
Basak, D.3
Sanchez-Garcia, M.A.4
Munoz, E.5
Izpura, I.6
Calle, F.7
Tijero, J.M.G.8
Sanchez-Rojas, J.L.9
Beaumont, B.10
Lorenzini, P.11
Gibart, P.12
-
16
-
-
59649099089
-
-
10.1109/LED.2008.2010067
-
G. Meneghesso, F. Zanon, M. Uren, and E. Zanoni, IEEE Electron Device Letters 30, 100 (2009). 10.1109/LED.2008.2010067
-
(2009)
IEEE Electron Device Letters
, vol.30
, pp. 100
-
-
Meneghesso, G.1
Zanon, F.2
Uren, M.3
Zanoni, E.4
-
17
-
-
77951599229
-
-
APPLAB 0003-6951,. 10.1063/1.3389497
-
A. Sedhain, J. Li, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. APPLAB 0003-6951 96, 151902 (2010). 10.1063/1.3389497
-
(2010)
Appl. Phys. Lett.
, vol.96
, pp. 151902
-
-
Sedhain, A.1
Li, J.2
Lin, J.Y.3
Jiang, H.X.4
-
18
-
-
76449115448
-
-
APPLAB 0003-6951,. 10.1063/1.3293008
-
Y. S. Puzyrev, B. R. Tuttle, R. D. Schrimpf, D. M. Fleetwood, and S. T. Pantelides, Appl. Phys. Lett. APPLAB 0003-6951 96, 053505 (2010). 10.1063/1.3293008
-
(2010)
Appl. Phys. Lett.
, vol.96
, pp. 053505
-
-
Puzyrev, Y.S.1
Tuttle, B.R.2
Schrimpf, R.D.3
Fleetwood, D.M.4
Pantelides, S.T.5
-
19
-
-
0000159797
-
-
APPLAB 0003-6951,. 10.1063/1.125322
-
J. S. Colton, P. Y. Yu, K. L. Teo, E. R. Weber, P. Perlin, I. Grzegory, and K. Uchida, Appl. Phys. Lett. APPLAB 0003-6951 75, 3273 (1999). 10.1063/1.125322
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 3273
-
-
Colton, J.S.1
Yu, P.Y.2
Teo, K.L.3
Weber, E.R.4
Perlin, P.5
Grzegory, I.6
Uchida, K.7
|