Nanoscale spectroscopic imaging of organic semiconductor films by plasmon-polariton coupling

Physical Review Letters

Volumn 104, Issue 5, 2010, Pages

  Zhang, D ^a   Heinemeyer, U ^a   Stanciu, C ^a   Sackrow, M ^a   Braun, K ^a   Hennemann, L E ^a   Wang, X ^a   Scholz, R ^b   Schreiber, F ^a   Meixner, A J ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITON-POLARITON; FILM MORPHOLOGY; HIGH NUMERICAL APERTURES; HIGH SPATIAL RESOLUTION; MOLECULAR DOMAINS; MOLECULAR LAYER; NANO SCALE; NEAR-FIELD OPTICAL IMAGES; OPTICAL CONTRAST; ORGANIC SEMICONDUCTOR FILMS; PARABOLIC MIRRORS; PLASMON-POLARITONS; RAMAN SPECTRA; SIGNAL COLLECTION; SPECTROSCOPIC IMAGING; TOPOGRAPHIC IMAGES;

GEOMETRICAL OPTICS; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; RAMAN SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 76249102345     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.056601     Document Type: Article

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