Reduced intermolecular interaction in organic ultrathin films

Applied Physics Letters

Volumn 88, Issue 14, 2006, Pages

  Gordan, O D ^a   Himcinschi, C ^a,d   Zahn, D R T ^a   Cobet, C ^b   Esser, N ^b   Braun, W ^c  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERMOLECULAR INTERACTION; MOLECULAR TRANSITIONS; ORGANIC ULTRATHIN FILMS; TRIS(8-HYDROXYQUINOLINE)- ALUMINUM;

DEPOSITION; DIELECTRIC PROPERTIES; MOLECULAR DYNAMICS; MONOLAYERS; ORGANIC COMPOUNDS; ULTRAHIGH VACUUM;

ULTRATHIN FILMS;

EID: 33646673389     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2189153     Document Type: Article

References (16)

1. H. Proehl, T. Dienel, R. Nitsche, and T. Fritz, Phys. Rev. Lett. 93, 097403 (2004).
2. L. C. Palilis, A. J. Mäkinen, M. Uchida, and Z. H. Kafafi, Appl. Phys. Lett. 82, 2209 (2003).
3. W. Gao and A. Kahn, J. Appl. Phys. 94, 359 (2003).
4. L. S. Hung and C. H. Chen, Mater. Sci. Eng., R. R39, 143 (2002).
5. C. H. Kim and J. Shinar, Appl. Phys. Lett. 80, 2201 (2002).
6. T. Mori, H. G. Kim, T. Mizutani, and D. C. Lee, J. Appl. Phys. 40, 5346 (2001).
7. M. Brinkmann, G. Gadret, M. Muccini, C. Taliani, N. Masciocchi, and A. Sironi, J. Am. Chem. Soc. 122, 5147 (2000).
8. D. Aspnes, in Spectroscopic Ellipsometry of Solids, edited by, B. Seraphin, (North-Holland, Amsterdam, 1976), Chap.
9. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, Amsterdam, 1992).
10. G. Bauer and W. Richter, Optical Characterization of Epitaxial Semiconductor Layers (Springer, Berlin, 1996).
11. W. Mönch, Semiconductor Surfaces and Interfaces (Springer, Berlin, 1993).
12. R. L. Johnson, J. Barth, M. Cardona, D. Fuchs, and A. M. Bradshaw, Rev. Sci. Instrum. 60, 2209 (1989).
13. J. Barth, R. L. Johnson, and M. Cardona, Handbook of Optical Constants of Solids II, edited by, E. Palik, (Academic, New York, 1991).
14. T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, R. L. Johnson, and M. Cardona, Thin Solid Films 313-314, 745 (1998).
15. C. Himcinschi, O. Gordan, G. Salvan, C. Cobet, N. Esser, W. Braun, F. Müller, N. Meyer, M. Heuken, and D. R. T. Zahn, Appl. Phys. Lett. 86, 111907 (2005).
16. C. Himcinschi, N. Meyer, S. Hartmann, M. Gersdorff, M. Friedrich, H. H. Johannes, W. Kowalsky, M. Schwambera, G. Strauch, M. Heuken, and D. R. T. Zahn, Appl. Phys. A A80, 551 (2005).