Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

Journal of Chemical Physics

Volumn 119, Issue 12, 2003, Pages 6335-6340

  Alonso, M I ^a   Garriga, M ^a   Osso J O ^a,b   Schreiber, F ^b,c,d   Barrena, E ^b   Dosch, H ^b,c  

^a CSIC   (Spain)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

^d UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BAND STRUCTURE; COPPER COMPOUNDS; DIELECTRIC PROPERTIES; ELLIPSOMETRY; LIGHT POLARIZATION; MOLECULAR BEAMS; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

MOLECULAR STACKINGS;

THIN FILMS;

EID: 0142090144     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1602056     Document Type: Article

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