SCOPUS 정보 검색 플랫폼

Advanced Functional Materials

Volumn 12, Issue 6-7, 2002, Pages 455-460

Controlled molecular alignment in phthalocyanine thin films on stepped sapphire surfaces

(7) Osso J O a,b Schreiber, F a,c Kruppa, V a Dosch, H a,c Garriga, M b Alonso, M I b Cerdeira, F b,d

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

b INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC (Spain)

c UNIVERSITY OF STUTTGART (Germany)

d UNIVERSITY OF CAMPINAS (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; LATTICE CONSTANTS; MAGNESIA; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; OXIDATION; RAMAN SCATTERING; SAPPHIRE; SILICON WAFERS; THERMAL EFFECTS; X RAY ANALYSIS;

COPPER HEXADECAFLUOROPHTHALOCYANINE; ORGANIC MOLECULAR BEAM DEPOSITION; X RAY ROCKING WIDTHS;

ORGANIC COMPOUNDS;

EID: 0036611620 PISSN: 1616301X EISSN: None Source Type: Journal
DOI: 10.1002/1616-3028(20020618)12:6/7<455::AID-ADFM455>3.0.CO;2-I Document Type: Article

Times cited : (69)

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