Characterisation of size-controlled and red luminescent Ge nanocrystals in multilayered superlattice structure

Thin Solid Films

Volumn 518, Issue 19, 2010, Pages 5483-5487

  Zhang, B ^a   Shrestha, S ^a   Aliberti, P ^a   Green, M A ^a   Conibeer, G ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Ge; Multilayer; Nanocrystal; Photoluminescence; Size control

Indexed keywords

AVERAGE SIZE; BLUE SHIFT; BROAD BANDS; CHARACTERISATION; GE; GE NANOCRYSTALS; MULTI-LAYERED; NANOCRYSTAL SIZES; OPTICAL ABSORPTION; OPTICAL ABSORPTION EDGE; RED LUMINESCENCE; SIZE-CONTROL; SPUTTERING TIME; SUPER-LATTICE STRUCTURES; THEORETICAL CALCULATIONS; X-RAY DIFFRACTION MEASUREMENTS;

ABSORPTION; LIGHT ABSORPTION; MULTILAYERS; NANOCRYSTALS; PHOTOLUMINESCENCE; SPUTTERING; SUPERLATTICES; X RAY DIFFRACTION;

GERMANIUM;

EID: 77955654127     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.04.024     Document Type: Article

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