Growth mechanisms and thickness effect on the properties of Al-doped ZnO thin films grown on polymeric substrates

Physica Status Solidi (A) Applications and Materials Science

Volumn 207, Issue 7, 2010, Pages 1581-1585

  Koidis, Christos ^a   Logothetidis, Stergios ^a   Kassavetis, Spiridon ^a   Laskarakis, Argiris ^a   Hastas, Nikolaos A ^a   Valassiades, Odisseas ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Doping; Growth; Mechanical properties; Optical properties; Sputtering; Structure; ZnO

Indexed keywords

AZO FILMS; CARRIER DENSITY; CONDUCTIVITY MEASUREMENTS; DOPING; GRAZING INCIDENCE; GROWTH; GROWTH MECHANISMS; IN-SITU; ISLAND GROWTH; NANO-INDENTATION MEASUREMENTS; POLYMERIC SUBSTRATE; PROPERTIES OF AL; PULSED DC MAGNETRON SPUTTERING; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; STRUCTURAL CHARACTERISTICS; STRUCTURE; TARGET POWER; THICKNESS EFFECT; X-RAY DIFFRACTION TECHNIQUES; ZNO;

ALUMINUM; DC POWER TRANSMISSION; DEFECTS; DOPING (ADDITIVES); ELECTRON TRAPS; FILM GROWTH; GRAIN BOUNDARIES; NANOINDENTATION; OPTICAL FILMS; OPTICAL PROPERTIES; POLYETHYLENE TEREPHTHALATES; POLYMERIC FILMS; SPECTROSCOPIC ELLIPSOMETRY; THERMOPLASTICS; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

MECHANICAL PROPERTIES;

EID: 77955615624     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200983767     Document Type: Article

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