In-situ and real-time investigation of ZnO thin films growth onto rigid and flexible substrates

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1366-1369

  Koidis, C ^a   Logothetidis, S ^a   Georgiou, D ^a   Laskarakis, A ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

APPROPRIATE MODELS; GROWTH MECHANISMS; IN-SITU; INTRINSIC PROPERTY; MATERIAL RESPONSE; OPTICAL PARAMETER; OPTIMUM DEPOSITION; REAL TIME MEASUREMENTS; RIGID AND FLEXIBLE SUBSTRATES; SI SUBSTRATES; SPECTRAL REGION; TEREPHTHALATE; TIME DEPENDENCE; ZNO; ZNO THIN FILM;

ETHYLENE; METALLIC FILMS; OPTICAL FILMS; SEMICONDUCTING SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SPONTANEOUS EMISSION; THIN FILMS; TIME MEASUREMENT; ZINC;

ZINC OXIDE;

EID: 54249161761     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777872     Document Type: Conference Paper

References (9)

1. A. N. Banerjee, C. K. Ghosh, K. K. Chattopadhyay, H. Minoura, A. K. Sarkar, A. Akiba, A. Kamiya, and T. Endo, Thin Solid Films 496, 112 (2006).
2. M. Suchea, S. Christoulakis, K. Moschovis, N. Katsarakis, and G. Kiriakidis, Thin Solid Films 515, 551 (2006).
3. Ch. Jagadish and St. Pearton, Zinc Oxide Bulk, Thin Films and Nanostructures-Processing, Properties and Applications (Elsevier, 2006).
4. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North Holland, Amsterdam, 1977).
5. G. E. Irene and H. G. Tompkins (Ed.), Handbook of Ellipsometry (William Andrew Publishing, Norwich, N.Y., 2005).
6. G. E. Jellison and F. A. Modine, Appl. Phys. Lett. 69, 371 (1996).
7. M. Gioti, A. Laskarakis, and S. Logothetidis, Thin Solid Films 455/456, 283 (2004).
8. Y. Caglar, S. Ilican, M. Caglar, and F. Yakuphanoglu, Spectrochim. Acta A 67, 1113 (2007).
9. C. Koidis, S. Logothetidis, D. Georgiou, A. Laskarakis, N. Goktsis, S. Lousinian, I. Tsiaoussis, and N. Frangis, submitted to E-MRS Spring Meeting (2007).