Compositional depth profiling of polycrystalline thin films by grazing-incidence X-ray diffraction

Journal of Applied Crystallography

Volumn 39, Issue 5, 2006, Pages 683-696

  Kotschau I M ^a   Schock, H W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33748783350     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188980601987X     Document Type: Article

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