Flexible formation of coherent probes on an aberration-corrected STEM with three condensers

Journal of Electron Microscopy

Volumn 59, Issue SUPPL. 1, 2010, Pages

  Yi, Feng ^a   Tiemeijer, Peter ^b   Voyles, Paul M ^a  

^a University of Wisconsin Madison   (United States)

^b Thermo Fisher Scientific   (United States)

Author keywords

aberration correction; coherence; diffraction; probe formation

Indexed keywords

ABERRATIONS; SYNTHETIC APERTURES; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION-CORRECTED; COHERENT PROBE; DIFFRACTION MEASUREMENTS; ELECTRON PROBE; GEOMETRIC OPTICS; PROBE FORMATION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; VIRTUAL APERTURES; VIRTUAL SOURCES;

PROBES;

EID: 77955535894     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq052     Document Type: Conference Paper

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