Comparison of fluctuation electron microscopy theories and experimental methods

Journal of Physics Condensed Matter

Volumn 19, Issue 45, 2007, Pages

  Stratton, W G ^a   Voyles, P M ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; CORRELATION METHODS; DATA ACQUISITION; IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

FLUCTUATION ELECTRON MICROSCOPY (FEM); NANODIFFRACTION; NANOSCALE STRUCTURAL ORDER;

AMORPHOUS MATERIALS;

EID: 36049005981     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/45/455203     Document Type: Conference Paper

References (35)

1. Cusack N 1987 The Physics of Structurally Disordered Matter (Bristol: Institute of Physics Publishing)
2. Ossi P M 2003 Disordered Materials; An Introduction (Heidelberg: Springer)
3. Uchino T et al 2005 Real and reciprocal space structural correlations contributing to the first sharp diffraction peak in silica glass Phys. Rev. B 71 014202
4. Voyles P M, Gibson J M and Treacy M M J 2000 Fluctuation microscopy: a probe of atomic correlations in disordered materials J. Electron Microsc. 49 259-66
5. Voyles P M 2001 Fluctuation electron microscopy of medium-range order in amorphous silicon Physics (Urbana, Champaign: University of Illinois at Urbana-Champaign)
6. Nakhmanson S M et al 2001 Realistic models of paracrystalline silicon Phys. Rev. B 63 235207
7. Fortner J and Lannin J S 1988 Phys. Rev. B 37 10154
8. Falk M L 1999 Molecular-dynamics study of ductile and brittle fracture in model noncrystalline solids Phys. Rev. B 60 7062-70
9. Hufnagel T C et al 2002 Controlling shear band behavior in metallic glass through microstructural design Intermetallics 10 1163-6
10. 8 measured by fluctuation electron microscopy Appl. Phys. Lett. 86 (14)
11. Krivanek O L and Howie A 1975 J. Appl. Crystallogr. 8 213
12. Dyck D V et al 2003 Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Ultramicroscopy 98 27-42
13. Treacy M M J and Gibson J M 1996 Variable coherence microscopy: a rich source of structural information from disordered systems Acta Crystallogr. A 52 212-20
14. Treacy M M J et al 2005 Fluctuation microscopy: a probe into medium range order Rep. Prog. Phys. 68 2899-944
15. Gibson J M, Treacy M M J and Voyles P M 2000 Atom pair persistence in disordered materials from fluctuation microscopy Ultramicroscopy 83 169-78
16. Reimer L 1997 Transmission Electron Microscopy; Physics of Image Formation and Microanalysis (Optical Sciences vol 36) 4th edn ed H Lotsch (Berlin: Springer)
17. Kirkland E J 1998 Advanced Computing in Electron Microscopy (New York: Plenum)
18. Voyles P M and Muller D A 2002 Fluctuation microscopy in the STEM Ultramicroscopy 93 147-59
19. Nittala L N et al 2005 Hydrogen-induced modification of the medium-range structural order in amorphous silicon films Appl. Phys. Lett. 87 (24)
20. Stratton W G and Voyles P M 2007 A phenomenological theory of fluctuation electron microscopy for a nanocrystal/amorphous composite Ultramicroscopy submitted
21. Voyles P M et al 2001 Structure and physical properties of paracrystalline atomistic models of amorphous silicon J. Appl. Phys. 90 4437-51
22. Treacy M M J, Gibson J M and Keblinski P J 1998 Paracrystallites found in evaporated amorphous tetrahedral semiconductors J. Non-Cryst. Solids 231 99-110
23. 5 analyzed by fluctuation electron microscopy. Appl. Phys. Lett. 90 021923
24. Li J, Gu X and Hufnagel T C 2003 Using fluctuation microscopy to characterize structural order in metallic glass Microsc. Microanal. 9 509
25. James E M and Rodenburg J M 1997 Method for measuring the effective source coherence in a field emission transmission electron microscope Appl. Surf. Sci. 111 174-9
26. Dwyer C et al 2007 Electron nanodiffraction using sharply focused parallel probes Appl. Phys. Lett. 90 151104
27. Stratton W G et al 2006 Electron beam induced crystallization of amorphous Al-based alloys in the TEM Intermetallics 14 1061
28. Treacy M M J and Gibson J M 1993 Coherence and multiple scattering in 'Z-contrast' images Ultramicroscopy 52 31-53
29. Treacy M M J and Gibson J M 1994 Erratum to 'coherence and multiple scattering in 'Z-contrast' images' Ultramicroscopy 54 93 (erratum)
30. Khare S V et al 2004 Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon Appl. Phys. Lett. 85 745-7
31. Dash R K et al 2003 A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs J. Phys.: Condens. Matter 15 (30)
32. Bogle S N et al 2007 Quantifying nanoscale order in amorphous materials: simulating fluctuation electron microscopy J. Phys.: Condens. Matter at press
33. Boothroyd C B 2000 Quantification of high-resolution electron microscope images of amorphous carbon Ultramicroscopy 83 159-68
34. Howie A 2004 Hunting the Stobbs factor Ultramicroscopy 98 73-9
35. Treacy M M J, Voyles P M and Gibson J M 2000 Schläfli cluster topological analysis of medium range order in paracrystalline amorphous semiconductor models J. Non-Cryst. Solids 266 150-5